L&T Technology Services
Keyskills: Built-in self-test, SCAN, SCAN stuck-at, SCAN at-speed, Mentor Graphics EDT, On chip clock controller, OCC, Mentor Graphics TestKompress, BSCAN, MBIST, BIST, Mentor TestKompress, TestKompress, dft, design for testability, design for testability
Summary: SCAN stuck-at and at-speed techniques. Fundamentals of SCAN stuck-at and at-speed techniques.
Bengaluru / Bangalore, Chennai